Pantheon SEMPARIS Le serveur des séminaires parisiens Paris

Statut Confirmé
Domaines cond-mat
Date Lundi 25 Avril 2022
Heure 13:30
Institut LPENS
Salle L378
Nom de l'orateur Zhai
Prenom de l'orateur Min
Addresse email de l'orateur
Institution de l'orateur Georgia Tech-Lorraine
Titre Nondestructive Testing and Material Characterization by Terahertz Pulsed Imaging and Time Domain Spectroscopy
Résumé This seminar argues the scientific studies and practical applications of Terahertz (THz) pulsed imaging and time-domain spectroscopy for nondestructive evaluation (NDE) and material characterization. For the thickness and uniformity measurement of optically thin layers on steel, post-signal-processing techniques are employed to beat the axial resolution limit to enable thickness measurements of optically thin layers. The success of characterizing mill-scale films on steel with thickness down to ~5 µm, and resolving individual layers in multilayer paint coatings, validates the applicability of THz technology to the steel industry. In addition, THz-based techniques are also utilized for stratigraphic characterization of materials that incorporate both optically thick and thin layers. The structure of samples with complex layer structures is reconstructed successfully after accounting for dispersion, even in the absence of prior structural information of the material investigated. THz technology is also employed for material characterization in a noncontact, nonionizing, and non-destructive manner. We not only investigate THz birefringence and surface homogeneity of nanoporous Al2O3 films grown through a two-step electrochemical anodization process, quality control of commercial injection-molded thermoplastic components, but also characterize the optical and dielectric properties of off-the-shelf thermoplastics for high-frequency microelectronics packaging over a broad frequency range. These findings demonstrate the promising laboratory- and field-based applications of THz science and technology.
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